id | field name | definition |
0 | MDR_ID |
binary uint16 | size: 2 |
Data Set Record identifier
|
|
1 | SyncStatus |
binary uint16 | size: 2 |
Time synchronization status, source and quality
|
|
2 | Day |
binary int32 | size: 4 |
Day of observation, days since 2000-01-01, UTC
unit: "days since 2000-01-01"
|
|
3 | Sec |
binary uint32 | size: 4 |
Second of day of observation, UTC
unit: "s"
|
|
4 | Microsec |
binary uint32 | size: 4 |
Microsecond of second of observation
unit: "1E-6 s"
|
|
5 | Probe1_I_Bias_Offset |
binary int32 (double) | size: 4 |
Probe 1 current bias offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
6 | Probe1_I_Slope_Offset |
binary int32 (double) | size: 4 |
Probe 1 current slope offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
7 | Probe1_I_Fit_Error |
binary int32 (double) | size: 4 |
Probe 1 current sweep fit error
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
8 | Probe1_U_Bias_Offset |
binary int32 (double) | size: 4 |
Probe 1 voltage bias offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
9 | Probe1_U_Slope_Offset |
binary int32 (double) | size: 4 |
Probe 1 voltage slope offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
10 | Probe1_U_Fit_Error |
binary int32 (double) | size: 4 |
Probe 1 voltage sweep fit error
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
11 | Probe2_I_Bias_Offset |
binary int32 (double) | size: 4 |
Probe 2 current bias offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
12 | Probe2_I_Slope_Offset |
binary int32 (double) | size: 4 |
Probe 2 current slope offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
13 | Probe2_I_Fit_Error |
binary int32 (double) | size: 4 |
Probe 2 current sweep fit error
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
14 | Probe2_U_Bias_Offset |
binary int32 (double) | size: 4 |
Probe 2 voltage bias offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
15 | Probe2_U_Slope_Offset |
binary int32 (double) | size: 4 |
Probe 2 voltage slope offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
16 | Probe2_U_Fit_Error |
binary int32 (double) | size: 4 |
Probe 2 voltage sweep fit error
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
17 | FP_I_Bias_Offset |
binary int32 (double) | size: 4 |
Face Plate current bias offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
18 | FP_I_Slope_Offset |
binary int32 (double) | size: 4 |
Face Plate current slope offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
19 | FP_I_Fit_Error |
binary int32 (double) | size: 4 |
Face Plate current sweep fit error
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
20 | FP_U_Bias_Offset |
binary int32 (double) | size: 4 |
Face Plate voltage bias offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
21 | FP_U_Slope_Offset |
binary int32 (double) | size: 4 |
Face Plate voltage slope offset
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
22 | FP_U_Fit_Error |
binary int32 (double) | size: 4 |
Face Plate voltage sweep fit error
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
23 | FP_I_offset |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Face Plate current offset measurements
unit: ""
|
|
|
24 | FP_U_offset |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Face Plate bias offset measurements
unit: ""
|
|
|
25 | P1_I_offset |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 1 current offset measurements
unit: ""
|
|
|
26 | P1_U_offset |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 1 bias offset measurements
unit: ""
|
|
|
27 | P1_ref_ADC2 |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 1 reference ADC2
unit: ""
|
|
|
28 | P1_ground |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 1 ground
unit: ""
|
|
|
29 | P2_I_offset |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 2 current offset measurements
unit: ""
|
|
|
30 | P2_U_offset |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 2 bias offset measurements
unit: ""
|
|
|
31 | P2_ref_ADC2 |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 2 reference ADC2
unit: ""
|
|
|
32 | P2_ground |
binary array[32] | size: 64 |
binary uint16 | size: 2 |
Probe 2 ground
unit: ""
|
|
|
33 | P1_Slope |
binary int32 (double) | size: 4 |
Probe 1 slope offset, determined on-board
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
34 | P1_Bias |
binary int32 (double) | size: 4 |
Probe 1 bias offset, determined on-board
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
35 | P1_Error |
binary int32 (double) | size: 4 |
Probe 1 sweep fit error, determined on-board
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
36 | P2_Slope |
binary int32 (double) | size: 4 |
Probe 2 slope offset, determined on-board
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
37 | P2_Bias |
binary int32 (double) | size: 4 |
Probe 2 bias offset, determined on-board
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|
38 | P2_Error |
binary int32 (double) | size: 4 |
Probe 2 sweep fit error, determined on-board
unit: "1E-8 V"
converted unit: "V" (multiply by 1/100000000)
|
|